Sources of variation in creep testing, William S. Loewenthal, David L. Ellis
Type
Creator
1
Content
1
Is part of
1
Mapped to
1
Label
Sources of variation in creep testing, William S. Loewenthal, David L. Ellis
Language
eng
Bibliography note
Includes bibliographical references (page 47)
resource.governmentPublication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary form
non fiction
Main title
Sources of variation in creep testing
Medium
electronic resource
Nature of contents
dictionariesbibliographytechnical reports
Oclc number
808724452
Responsibility statement
William S. Loewenthal, David L. Ellis
Series statement
NASA/TM, 2011-215493
Incoming Resources
- Has instance1