Capacitance cell measurement of the out-of-plane expansion of thin films, Chad R. Snyder, Frederick I. Mopsik
Type
Label
Capacitance cell measurement of the out-of-plane expansion of thin films, Chad R. Snyder, Frederick I. Mopsik
Language
eng
Bibliography note
Includes bibliographical references (pages 31-32)
resource.governmentPublication
federal national government publication
Illustrations
illustrations
Index
no index present
Literary Form
non fiction
Main title
Capacitance cell measurement of the out-of-plane expansion of thin films
Medium
electronic resource
Nature of contents
bibliographydictionaries
Oclc number
713565269
Responsibility statement
Chad R. Snyder, Frederick I. Mopsik
Series statement
NIST special publication, no. 960-7NIST recommended practice guide
Creator
Content
Other version
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- Has instance1
Outgoing Resources
- Contributor2
- Creator1
- Subject3
- Content1
- Is Part Of2
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